Jericho, M. H., et al. “Scanning Tunneling Microscope With Micrometer Approach and Thermal Compensation”. Review of Scientific Instruments, vol. 58, no. 8, 1987, pp. 1349-52, https://doi.org/10.1063/1.1139414.

Genre

  • Journal Article
Contributors
Author: Jericho, M. H.
Author: Dahn, Douglas C.
Author: Blackford, B. L.
Date Issued
1987
Note

JERICHO, MH, DALHOUSIE UNIV,DEPT PHYS,HALIFAX B3H 3J5,NS,CANADA.

WOODBURY; CIRCULATION FULFILLMENT DIV, 500 SUNNYSIDE BLVD, WOODBURY, NY 11797-2999

AMER INST PHYSICS

PT: J; CR: BINNIG G, 1982, HELV PHYS ACTA, V55, P726 BINNIG G, 1982, PHYS REV LETT, V49, P57 BLACKFORD BL, 1987, REV SCI INSTRUM, V58, P1343 BRYANT A, 1986, APPL PHYS LETT, V48, P832 DEMUTH JE, 1986, IBM J RES DEV, V30, P396 DRAKE B, 1986, REV SCI INSTRUM, V57, P441 GERBER C, 1986, REV SCI INSTRUM, V57, P221 HAMERS RJ, 1986, PHYS REV B, V34, P5343 MURALT P, 1986, IBM J RES DEV, V30, P443 SCHNEIR J, 1986, PHYS REV B, V34, P4979 SIMPSON AM, IN PRESS SONNENFELD R, 1986, SCIENCE, V232, P211 VANDEWALLE GFA, 1985, REV SCI INSTRUM, V56, P1573; NR: 13; TC: 19; J9: REV SCI INSTR; PG: 4; GA: J6076

Source type: Electronic(1)

Language

  • English

Subjects

  • Instruments & Instrumentation
  • Physics, Applied
Page range
1349-1352
Host Title
Review of Scientific Instruments
Host Abbreviated Title
Rev.Sci.Instrum.
Volume
58
Issue
8
ISSN
0034-6748
DOI
https://doi.org/10.1063/1.1139414

Department