Genre
- Journal Article
A Doppler broadening positron annihilation technique which allows for the study of near surface defects in bulk samples is described. The method is capable of observing changes in the homogeneous bulk defect concentration in a sample acid is also able to characterize spatially localized near-surface defects in bulk materials with a resolution of about 1 mm. The applicability of this method is demonstrated by measurements on a sample of polycrystalline aluminum into which defects have been introduced by mechanical deformation. Isochronal annealing studies have been used to characterize the defect recovery in this material and are compared with results of conventional Doppler broadening measurements.
UNIV WESTERN ONTARIO,DEPT PHYS,LONDON,ON N6A 3K7,CANADA.; Dunlap, RA, DALHOUSIE UNIV,DEPT PHYS,HALIFAX,NS B3H 3J5,CANADA.
AMSTERDAM; PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
ELSEVIER SCIENCE BV
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Source type: Electronic(1)
Language
- English
Subjects
- Nuclear Science & Technology
- Instruments & Instrumentation
- Physics, Atomic, Molecular & Chemical
- Physics, Nuclear