Genre
- Journal Article
Positron annihilation spectroscopy has been used to study silicon nitride films grown by plasma-enhanced chemical vapor deposition and annealed at different temperatures. For both silicon-rich and nitrogen-rich films, the positron line shape (S) parameter increases after annealing for 15 min at temperatures up to 700-800 degrees C. This is understood in terms of the fact that removal of the hydrogen by annealing leads to the presence of unpassivated silicon dangling bond sites and vacancy complexes. Annealing at higher temperatures leads to a reduction in the S parameter, consistent with further hydrogen removal producing unpassivated N- sites. (C) 1996 American Institute of Physics.
UNIV WESTERN ONTARIO,DEPT PHYS,LONDON,ON N6A 3K7,CANADA. MCMASTER UNIV,INST MAT RES,ACCELERATOR LAB,HAMILTON,ON L8S 4L7,CANADA.; Landheer, D, NATL RES COUNCIL CANADA,INST MICROSTRUCT SCI,OTTAWA,ON K1A 0R6,CANADA.
WOODBURY; CIRCULATION FULFILLMENT DIV, 500 SUNNYSIDE BLVD, WOODBURY, NY 11797-2999
AMER INST PHYSICS
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Source type: Electronic(1)
Language
- English
Subjects
- Physics, Applied
- defects
- THIN-FILMS
- EPITAXY
- ANNIHILATION