Cheung, Karen C., et al. “Apparent Size Correlation: A Simple Method to Determine Vertical Positions of Particles Using Conventional Microscopy”. 2014 IEEE 27th International Conference on Micro Electro Mechanical Systems (MEMS), San Francisco, CA, U.S.A., January 26-30, IEEE, 2014, pp. 939-42, https://scholar2.islandarchives.ca/islandora/object/ir%3A20417.

Genre

  • Conference Proceedings
Contributors
Author: Cheung, Karen C.
Author: Ahmadi, Ali
Contributor: 2014 IEEE 27th International Conference on Micro Electro Mechanical Systems (MEMS), San Francisco, CA, U.S.A., January 26-30
Author: Winer, Michael H.
Date Issued
2014
Publisher
IEEE

Language

  • English
Page range
939-942
Host Title
2014 IEEE 27th International Conference on Micro Electro Mechanical Systems (MEMS), San Francisco, CA, U.S.A., January 26-30

Department