Jericho, M. H., et al. “Scanning Tunneling Microscope Imaging Technique for Weakly Bonded Surface Deposits”. Journal of Applied Physics, vol. 65, no. 12, 1989, pp. 5237-9, https://doi.org/10.1063/1.343166.

Genre

  • Journal Article
Contributors
Author: Jericho, M. H.
Author: Dahn, Douglas C.
Author: Blackford, B. L.
Date Issued
1989
Note

TECH UNIV NOVA SCOTIA,DEPT ENGN PHYS,HALIFAX B3J 2X1,NS,CANADA.; JERICHO, MH, DALHOUSIE UNIV,DEPT PHYS,HALIFAX B3H 3J5,NS,CANADA.

WOODBURY; CIRCULATION FULFILLMENT DIV, 500 SUNNYSIDE BLVD, WOODBURY, NY 11797-2999

AMER INST PHYSICS

PT: J; CR: BLACKFORD BL, IN PRESS J MICROSC BLACKFORD BL, 1987, REV SCI INSTRUM, V58, P1343 FOSTER JS, IN PRESS J MICROSC GUCKENBERGER R, 1988, ULTRAMICROSCOPY, V25, P111 HANSMA PK, 1987, J APPL PHYS, V61, R1 MAMIN HJ, 1986, PHYS REV B, V34, P9015 SMITH D, IN PRESS J MICROSC; NR: 7; TC: 24; J9: J APPL PHYS; PG: 3; GA: U7926

Source type: Electronic(1)

Language

  • English

Subjects

  • Physics, Applied
Page range
5237-5239
Host Title
Journal of Applied Physics
Host Abbreviated Title
J.Appl.Phys.
Volume
65
Issue
12
ISSN
0021-8979

Department